中国物理快报  2012, Vol. 29 Issue (3): 38201-038201    DOI: 10.1088/0256-307X/29/3/038201
  CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY 本期目录 | 过刊浏览 | 高级检索 |
Characterization of a ZnO Epilayer Grown on Sapphire by using Rutherford Backscattering/Channeling and X-Ray Diffraction
DING Bin-Feng**
Department of Physics and Electronic Information, Langfang Teachers College, Langfang 065000
Characterization of a ZnO Epilayer Grown on Sapphire by using Rutherford Backscattering/Channeling and X-Ray Diffraction
DING Bin-Feng**
Department of Physics and Electronic Information, Langfang Teachers College, Langfang 065000