中国物理快报  2005, Vol. 22 Issue (10): 2700-2703    
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Comparative Characterization of InGaN/GaN Multiple Quantum Wells by Transmission Electron Microscopy, X-Ray Diffraction and Rutherford Backscattering
ZHOU Sheng-Qiang, WU Ming-Fang, YAO Shu-De, ZHANG Guo-Yi
School of Physics, Peking University, Beijing 100871
Comparative Characterization of InGaN/GaN Multiple Quantum Wells by Transmission Electron Microscopy, X-Ray Diffraction and Rutherford Backscattering
ZHOU Sheng-Qiang;WU Ming-Fang;YAO Shu-De;ZHANG Guo-Yi
School of Physics, Peking University, Beijing 100871