中国物理快报  2012, Vol. 29 Issue (2): 26101-026101    DOI: 10.1088/0256-307X/29/2/026101
  CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES 本期目录 | 过刊浏览 | 高级检索 |
Dislocation and Elastic Strain in an InN Film Characterized by Synchrotron Radiation X-Ray Diffraction and Rutherford Backscattering/Channeling
CHENG Feng-Feng1 , FA Tao1, WANG Xin-Qiang2, YAO Shu-De1**
1State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871
2State Key Laboratory of Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871
Dislocation and Elastic Strain in an InN Film Characterized by Synchrotron Radiation X-Ray Diffraction and Rutherford Backscattering/Channeling
CHENG Feng-Feng1 , FA Tao1, WANG Xin-Qiang2, YAO Shu-De1**
1State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871
2State Key Laboratory of Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871