Crystallization and Fractal Formation in Annealed Al/a-Ge Bilayer Films
WU Feng, ZHANG Shu-yuan, CHEN Zhi-wen, TAN Shun
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026
Crystallization and Fractal Formation in Annealed Al/a-Ge Bilayer Films
WU Feng;ZHANG Shu-yuan;CHEN Zhi-wen;TAN Shun
Structure Research Laboratory, University of Science and Technology of China, Hefei 230026
关键词 :
61.50.-f ,
61.16.Bg ,
61.72.Cc
Abstract : The crystallization and fractal formation in annealed Al/a-Ge bilayer films were studied. It was found that the effect of metal-mediated Crystallization increases with increasing annealing temperature and time. However, fractal patterns could be formed only in samples with proper thickness ratio. Some special phenomena at strain, broken, and step areas are also reported.
Key words :
61.50.-f
61.16.Bg
61.72.Cc
出版日期: 1997-10-01
引用本文:
WU Feng;ZHANG Shu-yuan;CHEN Zhi-wen;TAN Shun. Crystallization and Fractal Formation in Annealed Al/a-Ge Bilayer Films[J]. 中国物理快报, 1997, 14(10): 756-759.
WU Feng, ZHANG Shu-yuan, CHEN Zhi-wen, TAN Shun. Crystallization and Fractal Formation in Annealed Al/a-Ge Bilayer Films. Chin. Phys. Lett., 1997, 14(10): 756-759.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y1997/V14/I10/756
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