Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films
ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin
Structure Research Laboratory, University of Science and
Technology of China, Hefei 230026
Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films
ZHANG Shu-Yuan;PAN Deng-Yu;WU Zi-Qin
Structure Research Laboratory, University of Science and
Technology of China, Hefei 230026
关键词 :
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Abstract :Fractal crystallization in Au/a-Ge bilayer films was studied by in-situ plane-view and cross-section transmission electron microscopy. The experimental evidences suggest that the fractal crystallization is controlled by both diffusion and reaction processes. The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.
Key words :
61.16.Bg
出版日期: 2002-06-01
引用本文:
ZHANG Shu-Yuan;PAN Deng-Yu;WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films[J]. 中国物理快报, 2002, 19(6): 828-831.
ZHANG Shu-Yuan, PAN Deng-Yu, WU Zi-Qin. Insitu Plane-View and Cross-Section Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films. Chin. Phys. Lett., 2002, 19(6): 828-831.
链接本文:
https://cpl.iphy.ac.cn/CN/
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https://cpl.iphy.ac.cn/CN/Y2002/V19/I6/828
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