中国物理快报  2014, Vol. 31 Issue (07): 78503-078503    DOI: 10.1088/0256-307X/31/7/078503
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TixSb2Te Thin Films for Phase Change Memory Applications
TANG Shi-Yu1, LI Run2, OU Xin1, XU Han-Ni1, XIA Yi-Dong1**, YIN Jiang1, LIU Zhi-Guo1
1Department of Materials Science and Engineering, and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093
2Department of Physics, and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093