中国物理快报  2013, Vol. 30 Issue (6): 60702-060702    DOI: 10.1088/0256-307X/30/6/060702
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Dual-Frequency Atomic Force Microscopy Imaging Method and Experiment Based on Commercial AFM Platform
WANG Wei, QIAN Jian-Qiang**, LI Ying-Zi, CHEN Zhu-Li
Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Department of Applied Physics, Beihang University, Beijing 100191