The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell
YANG Jie1,2, PENG Gang2, LIU Cai-Long2, LU Han2, HAN Yong-Hao2**, GAO Chun-Xiao2**
1Department of Fundamental, Aviation University of Airforce, Changchun 130012 2State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012
Abstract：We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample. For the consideration of high accuracy of resistivity measurement, a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer. With this highly insulating layer, the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.
. [J]. 中国物理快报, 2013, 30(6): 60701-060701.
YANG Jie, PENG Gang, LIU Cai-Long, LU Han, HAN Yong-Hao, GAO Chun-Xiao . The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell. Chin. Phys. Lett., 2013, 30(6): 60701-060701.
2013, Vol. 30 
