Dielectric Enhancement and Maxwell-Wagner Effect in Polycrystalline BaTiO3 /Ba0.2 Sr0.8 TiO3 Multilayered Thin Films
GE Shui-Bing, SHEN Ming-Rong, NING Zhao-Yuan
Department of Physics, Suzhou University, Suzhou 215006
Dielectric Enhancement and Maxwell-Wagner Effect in Polycrystalline BaTiO3 /Ba0.2 Sr0.8 TiO3 Multilayered Thin Films
GE Shui-Bing;SHEN Ming-Rong;NING Zhao-Yuan
Department of Physics, Suzhou University, Suzhou 215006
关键词 ：
77.55.+f ,
68.65.+g ,
81.15.Fg
Abstract ： Polycrystalline BaTiO3 /Ba0.2 Sr0.8 TiO3 multilayer thin films were fabricated by pulsed-laser deposition onto Pt/Ti/SiO2 /Si substrates with various stacking periodicities. The dielectric constant of the films was obviously enhanced with decrease of the individual layer thickness, while the dielectric loss was kept at a low level comparable to that of the pure Ba0.6 Sr0.4 TiO3 thin films. The Maxwell-Wagner model is used to explain the experimental data.
Key words ：
77.55.+f
68.65.+g
81.15.Fg
出版日期: 2002-04-01
引用本文:
GE Shui-Bing;SHEN Ming-Rong;NING Zhao-Yuan. Dielectric Enhancement and Maxwell-Wagner Effect in Polycrystalline BaTiO3 /Ba0.2 Sr0.8 TiO3 Multilayered Thin Films
[J]. 中国物理快报, 2002, 19(4): 563-565.
3 /Ba0.2 Sr0.8 TiO3 Multilayered Thin Films
. Chin. Phys. Lett., 2002, 19(4): 563-565.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2002/V19/I4/563
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2002, Vol. 19 
