Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy
FANG Liang1, SHEN Ming-Rong1, LI Zhen-Ya1, CAO Wen-Wu2
1Department of Physics and Jiangsu Key Laboratory of Thin Films, Suzhou University, Suzhou 215006
2Department of Mathematics and Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA
Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy
1Department of Physics and Jiangsu Key Laboratory of Thin Films, Suzhou University, Suzhou 215006
2Department of Mathematics and Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA
Abstract： Impedance spectroscopy is performed to establish the electrical property and microstructure relations of the as-deposited and post-annealed polycrystalline CaCu3Ti4O12 (CCTO) films. Our results show that the resistance and capacitance of the grains and grain boundaries could be tuned by changing the annealing atmosphere and temperature. The simple resistor--capacitor equivalent circuit and the modified constant phase element (CPE) circuit are used to describe the impedance spectroscopy, and excellent agreement between the calculated and measured curves is obtained in the CPE circuit. Based on the experimental results, it is suggested that the origin of the semiconductivity of the grains in CCTO polycrystalline films originates from their oxygen-loss, while the grain boundaries are close to oxygen- stoichiometry.
FANG Liang;SHEN Ming-Rong;LI Zhen-Ya;CAO Wen-Wu. Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy[J]. 中国物理快报, 2006, 23(4): 990-993.
FANG Liang, SHEN Ming-Rong, LI Zhen-Ya, CAO Wen-Wu. Analysis of Electrical Properties of Post-Annealed Polycrystalline CaCu3Ti4O12 Films by Impedance Spectroscopy. Chin. Phys. Lett., 2006, 23(4): 990-993.
2006, Vol. 23 
