中国物理快报  2017, Vol. 34 Issue (8): 88501-    DOI: 10.1088/0256-307X/34/8/088501
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Total Ionizing Dose Response of Different Length Devices in 0.13μm Partially Depleted Silicon-on-Insulator Technology
Meng-Ying Zhang1,2**, Zhi-Yuan Hu1, Zheng-Xuan Zhang1, Shuang Fan1,2, Li-Hua Dai1,2, Xiao-Nian Liu1,2, Lei Song1,2
1State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050
2University of Chinese Academy of Sciences, Beijing 100049