Evidence of the Nano-sized Si Microstructure of Porous Si From
Scanning Tunneling Microscopy
WENG Yumin, YANG Xinju, CHEN Yufeng, ZONG Xiangfu
Department of Materials Science, Fudan University 200433
Evidence of the Nano-sized Si Microstructure of Porous Si From
Scanning Tunneling Microscopy
WENG Yumin;YANG Xinju;CHEN Yufeng;ZONG Xiangfu
Department of Materials Science, Fudan University 200433
关键词 :
36.40.+d ,
74.50.+r ,
78.55.-m
Abstract : Scanning tunneling microscopy was used to observe the morphological feature of luminescent porous Si Results show that the surface of porous Si consists of randomly distributed nano-sized Si grains, which may be Si clusters. No clear interface was found between the grains. Its microstructure looks like a sponge. Visible photoluminescence in porous Si is most likely due to the carrier confinement in this microstructure.
Key words :
36.40.+d
74.50.+r
78.55.-m
出版日期: 1994-06-01
引用本文:
WENG Yumin;YANG Xinju;CHEN Yufeng;ZONG Xiangfu. Evidence of the Nano-sized Si Microstructure of Porous Si From
Scanning Tunneling Microscopy
[J]. 中国物理快报, 1994, 11(6): 390-392.
WENG Yumin, YANG Xinju, CHEN Yufeng, ZONG Xiangfu. Evidence of the Nano-sized Si Microstructure of Porous Si From
Scanning Tunneling Microscopy
. Chin. Phys. Lett., 1994, 11(6): 390-392.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y1994/V11/I6/390
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