CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
|
|
|
|
Effect of Channel Length and Width on NBTI in Ultra Deep Sub-Micron PMOSFETs |
CAO Yan-Rong1, MA Xiao-Hua2, HAO Yue3, TIAN Wen-Chao1 |
1School of Mechano-electric Engineering, Xidian University, Xi'an 710071 2School of Technical Physics, Xidian University, Xi'an 710071 3Key Lab of Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071 |
|
Cite this article: |
CAO Yan-Rong, MA Xiao-Hua, HAO Yue et al 2010 Chin. Phys. Lett. 27 037301 |
|
|
|
Keywords:
73.40.Qv
85.30.Tv
|
|
Received: 01 August 2009
Published: 09 March 2010
|
|
PACS: |
73.40.Qv
|
(Metal-insulator-semiconductor structures (including semiconductor-to-insulator))
|
|
85.30.Tv
|
(Field effect devices)
|
|
|
|
|
[1] Chen C L, Chen M J, Wang C J and Wu K 2006 International Reliability Physics Symposium (San Jose, California 26--30 March 2006) 741 [2] Cao Y R, Ma X H, Hao Y, Zhang Y, Yu Li, Zhu Z W and Chen H F 2007 Chin. Phys. 16 1140 [3] Tsuchiya T 1987 IEEE Electron. Devices 34 2291 [4] Rosa G L, Guarin F, Rauch S, Acovic A, Lukaitis J and Crabbe E 1997 IEEE International Reliability Physics Symposium (Denver, Colorado 8--10 April 1997) 282 [5] J.Greg Massey 2004 IRW Final Report (S. Lake Tahoe, California 18--21 October 2004) 199 [6] Cellere G, Valentini M G and Paccagnella A 2004 IEEE Integrated Circuit Design and Technology (Austin, Texas 17--20 May 2004) 303 [7] Jin L and Xu M Z 2008 IEEE International Nanoelectronics Conference (24--27 March 2008) 597 [8] Chung S S, Chen S J, Yang W J and Yang J J 2001 IEEE International Reliability Physics Symposium (Orlando, Florida 30 April--3 May 2001) 419 [9] Chung S S, Yeh C H, Feng H J, Lai C S, Yang J J, Chen C C, Jin Y, Chen S C and Liang M S 2006 IEEE Devices Mater. Reliability 6 95 [10] Jha N K, Reddy P S and Rao V R 2005 IEEE International Reliability Physics Symposium (San Jose, California 17--21 April 2005) 524 [11] Luo Y, Orona J, Nayak D and Gitlin D 2007 IEEE International Reliability Physics Symposium (Phoenix, Arizona 15--19 April 2007) 264 [12] Lee Y H 2004 IEEE International Electron Devices Meeting (San Francisco, CA 13--15 December 2004) 481 [13] Sasada K, Arimoto M, Nagasawa H, Nishida A, Aoe H, Dan T, Fujiwara S, Matsushita Y and Yodoshi K 1998 IEEE Microelectronic Test Structures (Kanazawa, Japan 23--26 March 1998) 207 [14] Lu C Y, Lin H C and Lee Y J 2007 Microelectron. Reliability 47 924 [15] Zhang J F and Eccleston W 1998 IEEE Electron. Devices 45 116 [16] Liu Y and Zhang H F 2002 The Principle of Transistors |
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|