Chin. Phys. Lett.  2010, Vol. 27 Issue (3): 037301    DOI: 10.1088/0256-307X/27/3/037301
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Effect of Channel Length and Width on NBTI in Ultra Deep Sub-Micron PMOSFETs
CAO Yan-Rong1, MA Xiao-Hua2, HAO Yue3, TIAN Wen-Chao1
1School of Mechano-electric Engineering, Xidian University, Xi'an 710071 2School of Technical Physics, Xidian University, Xi'an 710071 3Key Lab of Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071
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CAO Yan-Rong, MA Xiao-Hua, HAO Yue et al  2010 Chin. Phys. Lett. 27 037301
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Keywords: 73.40.Qv      85.30.Tv     
Received: 01 August 2009      Published: 09 March 2010
PACS:  73.40.Qv (Metal-insulator-semiconductor structures (including semiconductor-to-insulator))  
  85.30.Tv (Field effect devices)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/27/3/037301       OR      https://cpl.iphy.ac.cn/Y2010/V27/I3/037301
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CAO Yan-Rong
MA Xiao-Hua
HAO Yue
TIAN Wen-Chao
[1] Chen C L, Chen M J, Wang C J and Wu K 2006 International Reliability Physics Symposium (San Jose, California 26--30 March 2006) 741
[2] Cao Y R, Ma X H, Hao Y, Zhang Y, Yu Li, Zhu Z W and Chen H F 2007 Chin. Phys. 16 1140
[3] Tsuchiya T 1987 IEEE Electron. Devices 34 2291
[4] Rosa G L, Guarin F, Rauch S, Acovic A, Lukaitis J and Crabbe E 1997 IEEE International Reliability Physics Symposium (Denver, Colorado 8--10 April 1997) 282
[5] J.Greg Massey 2004 IRW Final Report (S. Lake Tahoe, California 18--21 October 2004) 199
[6] Cellere G, Valentini M G and Paccagnella A 2004 IEEE Integrated Circuit Design and Technology (Austin, Texas 17--20 May 2004) 303
[7] Jin L and Xu M Z 2008 IEEE International Nanoelectronics Conference (24--27 March 2008) 597
[8] Chung S S, Chen S J, Yang W J and Yang J J 2001 IEEE International Reliability Physics Symposium (Orlando, Florida 30 April--3 May 2001) 419
[9] Chung S S, Yeh C H, Feng H J, Lai C S, Yang J J, Chen C C, Jin Y, Chen S C and Liang M S 2006 IEEE Devices Mater. Reliability 6 95
[10] Jha N K, Reddy P S and Rao V R 2005 IEEE International Reliability Physics Symposium (San Jose, California 17--21 April 2005) 524
[11] Luo Y, Orona J, Nayak D and Gitlin D 2007 IEEE International Reliability Physics Symposium (Phoenix, Arizona 15--19 April 2007) 264
[12] Lee Y H 2004 IEEE International Electron Devices Meeting (San Francisco, CA 13--15 December 2004) 481
[13] Sasada K, Arimoto M, Nagasawa H, Nishida A, Aoe H, Dan T, Fujiwara S, Matsushita Y and Yodoshi K 1998 IEEE Microelectronic Test Structures (Kanazawa, Japan 23--26 March 1998) 207
[14] Lu C Y, Lin H C and Lee Y J 2007 Microelectron. Reliability 47 924
[15] Zhang J F and Eccleston W 1998 IEEE Electron. Devices 45 116
[16] Liu Y and Zhang H F 2002 The Principle of Transistors
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