| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Extraction of Parameters of Random Self-Affine Fractal Surfaces from Light Scattered Intensity by Levenberg-Marquardt Algorithm |
| ZHANG Ning-Yu1,2, TENG Shu-Yun1, SONG Hong-Sheng1,2, LIU Gui-Yuan1,2, CHENG Chuan-Fu1 |
| 1College of Physics and Electronics, Shandong Normal University, Jinan 2500142School of Science, Shandong Jianzhu University, Jinan 250101 |
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| Cite this article: |
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ZHANG Ning-Yu, TENG Shu-Yun, SONG Hong-Sheng et al 2009 Chin. Phys. Lett. 26 034209 |
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Abstract A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data. A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted (root-mean-square roughness w, lateral correlation length ξ, and roughness exponent α) are compared to those obtained using atomic force microscopy.
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| Keywords:
42.25.Fx
68.35.Ct
02.60.Pn
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Received: 18 June 2008
Published: 19 February 2009
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| PACS: |
42.25.Fx
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(Diffraction and scattering)
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68.35.Ct
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(Interface structure and roughness)
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02.60.Pn
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(Numerical optimization)
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