| Original Articles |
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Phase Determination Method to Directly Measure Intensity and Frequency of Temporal Profiles of Attosecond EUV Pulses |
| GE Yu-Cheng |
| Department of Technical Physics, Peking University, Beijing 100871 |
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| Cite this article: |
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GE Yu-Cheng 2005 Chin. Phys. Lett. 22 1916-1919 |
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Abstract A new method of phase determination is presented to directly measure the intensity and frequency temporal profiles of attosecond EUV pulses. The profiles can be reconstructed from the photoelectron energy spectra measured with two different laser intensities at 0°and 180° with respect to the linear laser polarization using a cross correlation between the femtosecond laser and the attosecond EUV. The method has a temporal measurement range from a quarter to about half of a laser oscillation period. The time resolution depends on the jitter and control precision of laser and EUV pulses. This method improves the time resolution in measuring attosecond EUV pulses.
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| Keywords:
42.65.Re
42.65.Ky
32.80.Rm
42.30.Rx
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Published: 01 August 2005
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| PACS: |
42.65.Re
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(Ultrafast processes; optical pulse generation and pulse compression)
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42.65.Ky
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(Frequency conversion; harmonic generation, including higher-order harmonic generation)
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32.80.Rm
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(Multiphoton ionization and excitation to highly excited states)
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42.30.Rx
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(Phase retrieval)
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