中国物理快报  1990, Vol. 7 Issue (7): 308-311    
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STUDY OF THE QUALITY OF GaAs THIN FILM ON Si SUBSTRATE BY X-RAY DIFFRACTION METHOD
LI Chaorong, MA1 Zhenhong, CUI Shufan, ZHOU Junming, Wang Yutian*
Institute of Physics, Academia Sinica, Beijing 100080 *Institute of Semiconductor, Academia Sinica, Beijing 100080
STUDY OF THE QUALITY OF GaAs THIN FILM ON Si SUBSTRATE BY X-RAY DIFFRACTION METHOD
LI Chaorong;MA1 Zhenhong;CUI Shufan;ZHOU Junming;Wang Yutian*
Institute of Physics, Academia Sinica, Beijing 100080 *Institute of Semiconductor, Academia Sinica, Beijing 100080