Abstract： The microstructure of alpha brass deformed to various degree ε was examined with positron annihilation technique and X-ray profile analysis. Stretch stress δ, positron annihilation probabilities Γ1, effective subgrain size Deff, positron lifetime T1 , dislocation density ρ, positron lifetime T2 and T etc. were measured as functions of deformation degree ε . Combined analyses of these curves were performed and positron annihilation models of single vacancy, dislocation, vacancy group and microvoid were suggested.
TENG Feng en;LIU Baozhang;LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION
[J]. 中国物理快报, 1990, 7(7): 312-315.
TENG Feng en, LIU Baozhang, LI Yanqin. COMBINED ANALYSIS OF DEFECT CONFIGURATION OF DEFORMED BRASS BY POSITRON ANNIHILATION AND X-RAY DIFFRACTION
. Chin. Phys. Lett., 1990, 7(7): 312-315.
1990, Vol. 7 
