中国物理快报  2020, Vol. 37 Issue (4): 46101-    DOI: 10.1088/0256-307X/37/4/046101
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Effects of Total-Ionizing-Dose Irradiation on Single-Event Burnout for Commercial Enhancement-Mode AlGaN/GaN High-Electron Mobility Transistors
Si-Yuan Chen1,2,3, Xin Yu1,2, Wu Lu1,2**, Shuai Yao1,2,3, Xiao-Long Li1,2,3, Xin Wang1,2, Mo-Han Liu1,2, Shan-Xue Xi1,2,3, Li-Bin Wang1,2, Jing Sun1,2, Cheng-Fa He1,2, Qi Guo1,2
1Key Laboratory of Functional Materials and Devices for Special Environments, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011
2Xinjiang Key Laboratory of Electronic Information Material and Device, Urumqi 830011
3University of Chinese Academy of Sciences, Beijing 100049