| CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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Achieving 1.2 fm/Hz$^{1/2}$ Displacement Sensitivity with Laser Interferometry in Two-Dimensional Nanomechanical Resonators: Pathways towards Quantum-Noise-Limited Measurement at Room Temperature |
| Jiankai Zhu1†, Luming Wang1†, Jiaqi Wu1†, Yachun Liang1, Fei Xiao1, Bo Xu1, Zejuan Zhang1, Xiulian Fan2, Yu Zhou2*, Juan Xia1*, and Zenghui Wang1,3* |
1Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, Chengdu 610054, China
2School of Physics and Electronics, Hunan Key Laboratory of Nanophotonics and Devices, Central South University, Changsha 410083, China
3State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China
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| Cite this article: |
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Jiankai Zhu, Luming Wang, Jiaqi Wu et al 2023 Chin. Phys. Lett. 40 038102 |
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Abstract Laser interferometry is an important technique for ultrasensitive detection of motion and displacement. We push the limit of laser interferometry through noise optimization and device engineering. The contribution of noises other than shot noise is reduced from 92.6% to 62.4%, demonstrating the possibility towards shot-noise-limited measurement. Using noise thermometry, we quantify the laser heating effect and determine the range of laser power values for room-temperature measurements. With detailed analysis and optimization of signal transduction, we achieve 1.2 fm/Hz$^{1/2}$ displacement measurement sensitivity at room temperature in two-dimensional (2D) CaNb$_{2}$O$_{6}$ nanomechanical resonators, the best value reported to date among all resonators based on 2D materials. Our work demonstrates a possible pathway towards quantum-noise-limited measurement at room temperature.
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Received: 28 January 2022
Express Letter
Published: 20 February 2023
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| PACS: |
07.10.Cm
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(Micromechanical devices and systems)
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81.07.Oj
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(Nanoelectromechanical systems (NEMS))
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85.85.+j
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(Micro- and nano-electromechanical systems (MEMS/NEMS) and devices)
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95.75.Kk
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(Interferometry)
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