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Direct ZnO X-Ray Detector with Tunable Sensitivity |
| Hui-Li Liang1**, Shu-Juan Cui1,2, Wen-Xing Huo1,2, Tao Wang1,2, Yong-Hui Zhang1,2, Bao-Gang Quan3, Xiao-Long Du1,2,4, Zeng-Xia Mei1** |
1Key Laboratory for Renewable Energy, Beijing Key Laboratory for New Energy Materials and Devices, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190
2School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049
3Laboratory of Microfabrication, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190
4Songshan Lake Materials Laboratory, Dongguan 523808
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| Cite this article: |
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Hui-Li Liang, Shu-Juan Cui, Wen-Xing Huo et al 2019 Chin. Phys. Lett. 36 110701 |
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Abstract Direct ZnO x-ray detectors with tunable sensitivity are realized by delicately controlling the oxygen flux during the sputtering deposition process. The photocurrents induced by x-rays from a 40 kV x-ray tube with a Cu anode increase apparently as the oxygen flux decreases, which is attributed to the introduction of $V_{\rm o}$ detects. By introducing $V_{\rm o}$ defects, the annihilation rate of the photo-generated electron-hole pairs will be greatly slowed down, leading to a remarkable photoconductive gain. This finding informs a novel way to design the x-ray detectors based on abundant oxide materials.
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Received: 20 May 2019
Published: 21 October 2019
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| PACS: |
07.85.Fv
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(X- and γ-ray sources, mirrors, gratings, and detectors)
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71.55.Gs
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(II-VI semiconductors)
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29.40.Wk
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(Solid-state detectors)
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81.15.Cd
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(Deposition by sputtering)
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| Fund: Supported by the National Natural Science Foundation of China under Grant Nos 11675280, 11674405, 61874139 and 11875088. |
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