| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Express Methods for Measurement of Electroconductivity of Semiconductor Layered Crystal |
| FILIPPOV V. V.1,2, VLASOV A. N.1 |
1Department of Physics, Lipetsk State Pedagogical University, Lipetsk 398020, Russian Federation
2Department of Natural Sciences and Technical Disciplines, the Branch in Lipetsk of Moscow State University of Technologies and Management, Lipetsk 398006, Russian Federation
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| Cite this article: |
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FILIPPOV V. V., VLASOV A. N. 2015 Chin. Phys. Lett. 32 117203 |
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Abstract We describe theoretically the grounded method of measuring the conductivity of anisotropic layered semiconductor materials. The suggested method implies the use of a four-probe testing device with a linear arrangement of probes. The final expressions for identifying the electrical conductivity are presented in the form of a series of analytic functions. The suggested method is experimentally verified, and practical recommendations of how to apply it are also provided.
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Received: 11 August 2015
Published: 01 December 2015
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| PACS: |
72.80.Cw
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(Elemental semiconductors)
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