Chin. Phys. Lett.  2015, Vol. 32 Issue (06): 065203    DOI: 10.1088/0256-307X/32/6/065203
PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES |
Simulation of Plasma Disruptions for HL-2M with the DINA Code
XUE Lei1**, DUAN Xu-Ru1, ZHENG Guo-Yao1, LIU Yue-Qiang2, YAN Shi-Lei1, DOKUKA V. V.3, KHAYRUTDINOV R. R.3, LUKASH V. E.4
1Southwestern Institute of Physics, Chengdu 610041
2Culham Centre for Fusion Energy, Culham Science Centre, Abingdon, OX14 3DB, United Kingdom
3TRINITI, Troitsk, Russia
4Kurchatov Institute, Moscow, Russia
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XUE Lei, DUAN Xu-Ru, ZHENG Guo-Yao et al  2015 Chin. Phys. Lett. 32 065203
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Abstract Plasma disruption is often an unavoidable aspect of tokamak operations. It may cause severe damage to in-vessel components such as the vacuum vessel conductors, the first wall and the divertor target plates. Two types of disruption, the hot-plasma vertical displacement event and the major disruption with a cold-plasma vertical displacement event, are simulated by the DINA code for HL-2M. The time evolutions of the plasma current, the halo current, the magnetic axis, the minor radius, the elongation as well as the electromagnetic force and eddy currents on the vacuum vessel during the thermal quench and the current quench are investigated. By comparing the electromagnetic forces before and after the disruption, we find that the disruption causes great damage to the vacuum vessel conductors. In addition, the hot-plasma vertical displacement event is more dangerous than the major disruption with the cold-plasma vertical displacement event.
Received: 11 March 2015      Published: 30 June 2015
PACS:  52.55.Dy (General theory and basic studies of plasma lifetime, particle and heat loss, energy balance, field structure, etc.)  
  52.55.Fa (Tokamaks, spherical tokamaks)  
  52.55.Rk (Power exhaust; divertors)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/32/6/065203       OR      https://cpl.iphy.ac.cn/Y2015/V32/I06/065203
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XUE Lei
DUAN Xu-Ru
ZHENG Guo-Yao
LIU Yue-Qiang
YAN Shi-Lei
DOKUKA V. V.
KHAYRUTDINOV R. R.
LUKASH V. E.
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