CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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A Study of GaN Grown on SiH4 Pre-Treated 6H-SiC Substrates |
SONG Shi-Wei1 , LIANG Hong-Wei1**, LIU Yang1, XIA Xiao-Chuan1, SHEN Ren-Sheng1, LUO Ying-Min1, DU Guo-Tong1,2 |
1School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024
2State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012
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Cite this article: |
SONG Shi-Wei, LIANG Hong-Wei, LIU Yang et al 2012 Chin. Phys. Lett. 29 018102 |
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Abstract GaN thin films are grown on Si-terminated (0001) 6H-SiC substrates pre-treated with SiH4 in a metal organic chemical vapor deposition system. The influence of the SiH4 pre−treatment conditions on the SiC surface is carefully investigated. It is found that SiH4 could react with the SiC surface oxide, which will change the surface termination. Moreover, our experiments demonstrate that SiH4 pre-treatment can distinctly influence the AlGaN nucleation layer and the basic characteristics of GaN.
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Keywords:
81.05.Ea
78.55.Cr
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Received: 20 September 2011
Published: 07 February 2012
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[1] Shen B, Shi H T, Zhang R, Chen Z Z and Zheng Y D 2001 Chin. Phys. Lett. 18 283
[2] Edmond J, Abare A, Bergman M, Bharathan J, Bunker K L, Emerson D, Haberern K, Ibbetson J, Leung M, Russel P and Slater D 2004 J. Cryst. Growth 272 242
[3] Sasaki T and Matsuoka T 1988 J. Appl. Phys. 64 4531
[4] Lin M E, Strite S, Agarwal A, Salvador A, Zhou G L, Teraguchi N, Rockett A and Morkoc H 1993 Appl. Phys. Lett. 62 702
[5] Xue Q Z, Xue Q K, Hasegawa Y, Tsong I S T and Sakurai T 1999 Appl. Phys. Lett. 74 2468
[6] Venneguesa P and Lahreche H 2000 Appl. Phys. Lett. 77 4310
[7] Kaplan R 1989 Surf. Sci. 215 111
[8] Leszczynski M, Teisseyre H, Suski T, Grzegory I, Bockowski M, Jun J, Porowski S, Pakula K, Baranowski J M, Foxon C T and Cheng T S 1996 Appl. Phys. Lett. 69 73
[9] Heying B, Wu X H, Keller S, Li Y, Kapolnek D, Keller B P, DenBaars S P and Speck J S 1996 Appl. Phys. Lett. 68 643
[10] Moram M A, Ghedia C S, Rao D V S, Barnard J S, Zhang Y, Kappers M J and Humphreys C J 2009 J. Appl. Phys. 106 073513
[11] Hino T, Tomiya S, Miyajima T, Yanashima K, Hashimoto S and Ikeda M 2000 Appl. Phys. Lett. 76 3421
[12] Pankove J I and Hutchby J A 1976 J. Appl. Phys. 47 5387
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