FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells |
LI Yuan-Yuan1,2,4, LI-Li1, BAI Jin-Tao2, LI Chang-Biao3, ZHANG Yan-Peng3, HOU Xun2,4 |
1Institute of Optics and Electronics, Department of Physics,Xi'an University of Arts and Science, Xi'an 7100652Institute of Photonics and Photonic Technology, Key Laboratory ofPhotoelectronic Technology of Shaanxi Province, Northwest University,Xi'an 7100693Key Laboratory for Physical Electronics and Devices of the Ministryof Education, Xi'an Jiaotong University, Xi'an 7100494State Key Laboratory of Transient Optics and Technology, Xi'anInstitute of Optics and Precision Mechanics, Chinese Academy of Sciences,Xi'an 710068 |
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Cite this article: |
LI Yuan-Yuan, LI-Li, BAI Jin-Tao et al 2010 Chin. Phys. Lett. 27 044203 |
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Abstract Dressed four-wave mixing (DFWM) spectroscopy is investigated theoretically in some micrometric thin cells. It is found that DFWM spectra can be modified by polarization interference of atoms and transient effects induced by atom-wall collision. This modification can lead to width-narrowing of DFWM lines and facilitates to implement experiment of high resolution DFWM spectroscopy in a confined atomic system.
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Keywords:
42.50.Gy
32.80.Qk
42.65.-k
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Received: 24 June 2009
Published: 27 March 2010
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PACS: |
42.50.Gy
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(Effects of atomic coherence on propagation, absorption, and Amplification of light; electromagnetically induced transparency and Absorption)
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32.80.Qk
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(Coherent control of atomic interactions with photons)
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42.65.-k
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(Nonlinear optics)
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Abstract
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