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Acoustic Imaging Frequency Dynamics of Ferroelectric Domains by Atomic Force Microscopy |
ZHAO Kun-Yu1, ZENG Hua-Rong1, SONG Hong-Zhang1, HUI Sen-Xing1, LI Guo-Rongv1, YIN Qing-Rui1, Kiyoshi Shimamura2, Chinna Venkadasamy Kannan2, Encarnacion Antonia Garcia Villora2, Shunji Takekawa2, Kenji Kitamura2 |
1State Key Lab of High Performance Ceramics and Superfine Structures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 2000502Optronic Materials Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan |
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Cite this article: |
ZHAO Kun-Yu, ZENG Hua-Rong, SONG Hong-Zhang et al 2008 Chin. Phys. Lett. 25 3429-3432 |
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Abstract We report the acoustic imaging frequency dynamics of ferroelectric domains by low-frequency acoustic probe microscopy based on the commercial atomic force microscopy. It is found that ferroelectric domain could be firstly visualized at lower frequency down to 0.5kHz by AFM-based acoustic microscopy. The frequency-dependent acoustic signal revealed a strong acoustic response in the frequency range from 7kHz to 10kHz, and reached maximum at 8.1kHz. The acoustic contrast mechanism can be ascribed to the different elastic response of ferroelectric microstructures to local elastic stress fields, which is induced by the acoustic wave transmitting in the sample when the piezoelectric transducer is vibrating and exciting acoustic wave under ac electric fields due to normal piezoelectric effects.
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Keywords:
77.84.-s
77.84.Dy
77.80.Dj
07.78.+s
07.79.Lh
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Received: 23 June 2008
Published: 29 August 2008
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PACS: |
77.84.-s
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(Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials)
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77.84.Dy
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77.80.Dj
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(Domain structure; hysteresis)
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07.78.+s
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(Electron, positron, and ion microscopes; electron diffractometers)
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07.79.Lh
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(Atomic force microscopes)
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[1] Loos J 2005 Adv. Mater. 17 1821 [2] Shekhawat G S and Dravid V P 2005 Science 31089 [3] Gruverman A et el 1998 Annu. Rev. Mater. Sci. 28 101 [4] Nagarajan V et el 2003 Nature Mater. 2 43 [5] Molotskii M et el 2003 Phys. Rev. Lett. 90107601 [6] Terabe K et el 2003 Appl. Phys. Lett. 82 433 [7] Kalinin S V 2004 Phys. Rev. B 70 184101 [8] Bai F M et el 2004 Appl. Phys. Lett. 85 2313 [9] Scrymgeour D and Gopalan V 2005 Phys. Rev. B 72 024103 [10] Paruch P et el 2005 Phys. Rev. Lett. 94197601 [11] Rabe U et el 2002 J. Phys. D.: Appl. Phys. 352621 [12] Hurley D C et el 2002 Meas. Sci. Technol. 162167 [13] Tsuji T, Ogiso H, Akedo J, Saito S, Fukuda K and YamanakaK 2004 Jpn. J. Appl. Phys. 43 2907 [14] Kolosov O V et el 1998 Phys. Rev. Lett. 811046 [15] Inagaki K et el 2000 Appl. Phys. Lett. 761836 [16] Matsuda O et el 2002 Jpn. J. Appl. Phys. 413545 [17] Liu X X et el 2002 J. Phys. D 35 74 [18] Zeng H R et el 2005 Solid State Commun. 133521 [19] Zeng H R et el 2005 Phys. Status Solidi 202R41 [20] Hertz H J 1882 J. Reine Angew. Math. 92 156 [21] Moulson A and Herbert J M 1990 Electroceramics(London: Chapman and Hall) [22] Burnham N A et el 1996 J. Vac. Sci. Technol. B 14 1308 |
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