Chin. Phys. Lett.  2001, Vol. 18 Issue (3): 408-410    DOI:
Original Articles |
Temperature Dependence of the Raman Spectra of Na2Si2O5
YOU Jing-Lin;JIANG Guo-Chang;XU Kuang-Di
Shanghai Enhanced Laboratory of Ferro-metallurgy, Shanghai University, Shanghai 200072
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YOU Jing-Lin, JIANG Guo-Chang, XU Kuang-Di 2001 Chin. Phys. Lett. 18 408-410
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Abstract The microstructures of Na2Si2O5 from room temperature up to 1773 K are studied by high temperature Raman spectroscopy. Deconvolutions of complex Raman spectra of crystal and amorphous states (glass and melt) are described. The results show that the temperature-dependent Raman spectra clearly indicate phase transition. Relative abundance of various kinds of SiO4 tetrahedrons (each Si binding to different number of bridging oxygens) can be qualitatively and quantitatively resolved as to be varied obviously with different temperatures. It manifests that high temperature Raman spectroscopy provides a useful tool for the microstructure research under high temperature and helps to explain the properties of silicate glasses and melts.

Keywords: 61.20.Qg      87.64.Je     
Published: 01 March 2001
PACS:  61.20.Qg (Structure of associated liquids: electrolytes, molten salts, etc.)  
  87.64.Je  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2001/V18/I3/0408
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XU Kuang-Di
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