Chin. Phys. Lett.  2001, Vol. 18 Issue (3): 405-407    DOI:
Original Articles |
Synchrotron X-Ray Study on Structures of Ni80Fe20/Cu Superlattices
XU Ming1;LUO Guang-Ming1;CHAI Chun-Lin1;YANG Tao1;MAI Zhen-Hong1;LAI Wu-Yan1;WU Zhong-Hua2;WANG De-Wu2
1Institute of Physics & Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080 2Synchrotron Radiation Laboratory, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039
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XU Ming, LUO Guang-Ming, CHAI Chun-Lin et al  2001 Chin. Phys. Lett. 18 405-407
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Abstract We showed that, in contrast to the results in literature, the Bragg peak intensity of Ni80Fe20/Cu superlattices is enhanced at the incident x-ray energy slightly higher than the absorption edge of the heavier element (Cu). The atomic density at Ni80Fe20/Cu interface was analysed by the diffraction anomalous fine structure technology with the incident angle of x-ray fixed at the first Bragg peak. Our results demonstrate the epitaxy growth of Ni80Fe20/Cu superlattices. Upon annealing, the epitaxity of Ni80Fe20/Cu multilayers becomes poor but the local crystallinity in each layer is improved.
Keywords: 61.10.Kw      75.70.-i     
Published: 01 March 2001
PACS:  61.10.Kw  
  75.70.-i (Magnetic properties of thin films, surfaces, and interfaces)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2001/V18/I3/0405
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XU Ming
LUO Guang-Ming
CHAI Chun-Lin
YANG Tao
MAI Zhen-Hong
LAI Wu-Yan
WU Zhong-Hua
WANG De-Wu
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