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Synchrotron X-Ray Study on Structures of Ni80Fe20/Cu Superlattices |
XU Ming1;LUO Guang-Ming1;CHAI Chun-Lin1;YANG Tao1;MAI Zhen-Hong1;LAI Wu-Yan1;WU Zhong-Hua2;WANG De-Wu2 |
1Institute of Physics & Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080
2Synchrotron Radiation Laboratory, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039 |
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Cite this article: |
XU Ming, LUO Guang-Ming, CHAI Chun-Lin et al 2001 Chin. Phys. Lett. 18 405-407 |
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Abstract We showed that, in contrast to the results in literature, the Bragg peak intensity of Ni80Fe20/Cu superlattices is enhanced at the incident x-ray energy slightly higher than the absorption edge of the heavier element (Cu). The atomic density at Ni80Fe20/Cu interface was analysed by the diffraction anomalous fine structure technology with the incident angle of x-ray fixed at the first Bragg peak. Our results demonstrate the epitaxy growth of Ni80Fe20/Cu superlattices. Upon annealing, the epitaxity of Ni80Fe20/Cu multilayers becomes poor but the local crystallinity in each layer is improved.
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Keywords:
61.10.Kw
75.70.-i
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Published: 01 March 2001
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PACS: |
61.10.Kw
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75.70.-i
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(Magnetic properties of thin films, surfaces, and interfaces)
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