Chin. Phys. Lett.  1996, Vol. 13 Issue (10): 772-774    DOI:
Original Articles |
Structural and Critical Behaviors of Ag Rough Films Deposited on Liquid Substrates
YE Gao-xiang1,2;FENG Chun-mu2;ZHANG Qi-rui2;GE Hong-liang2;ZHANG Xuan-jia2
1Department of Physics, Hangzhou University, Hangzhou 310028 2Department of Physics, Zhejiang University, Hangzhou 310027
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YE Gao-xiang, FENG Chun-mu, ZHANG Qi-rui et al  1996 Chin. Phys. Lett. 13 772-774
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Abstract A new Ag rough film system, deposited on silicone oil surfaces by rf-magnetron sputtering method, has been fabricated. The chrysanthemum-like surface morphology at micron length scale is observed. It is proposed that the anomalous critical behavior mainly results from the relative shift between the Ag atom clusters and the substrate. The discussion of the deposition mechanism is also presented.
Keywords: 64.60.Ak      73.61.At      68.90.+g     
Published: 01 October 1996
PACS:  64.60.Ak  
  73.61.At (Metal and metallic alloys)  
  68.90.+g (Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and low-dimensional structures)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1996/V13/I10/0772
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YE Gao-xiang
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