Property of Van Hove Critical Points in Fractional-Dimensional Space

Chin. Phys. Lett.

1993, Vol. 10

Issue (7): 385-388 DOI:

Original Articles

Property of Van Hove Critical Points in Fractional-Dimensional Space

YU Zhaoxian;MO Dang

Department of Physics, Zhongshan University, Guangzhou 510275

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YU Zhaoxian, MO Dang 1993 Chin. Phys. Lett. 10 385-388

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Abstract The model of fractional-dimensional space is used to study dielectric function associated with electron interband transitions near a Van Hove critical point in anisotropic systems. Using fractional derivative spectra (FDS) method, it is found that in fractional-dimensional space only a minimum yields a symmetric Lorentzian line shape in FDS but a maximum does not.

Keywords: 02.10.+w 71.20.Ad

Published: 01 July 1993

PACS:	02.10.+w
	71.20.Ad

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y1993/V10/I7/0385

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