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THE INSTENSITY RATIOS I(L)/I(K) FROM Ge TO Sn MEASURED IN TEM USING EDS |
| WU Zi-qin;DUAN Jian-zhong |
| Fundamental Physics Center, University of Science and Technology of China, Hefei, Anhui |
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| Cite this article: |
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WU Zi-qin, DUAN Jian-zhong 1985 Chin. Phys. Lett. 2 257-260 |
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Abstract The intensity ratios I(L)/I(K) from Ge to Sn have been measured in a Transmission electron microscope (TEM) using X-ray energy dispersive spectroscopy (EDS) at 40, 80, 100, 120, 160, 200kV. The large discrepancy between experimental and calculated values indicates that the formula of ionization cross-section should be revised.
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Published: 01 June 1985
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