Structural Distortion and Defects in Ti$_{3}$AlC$_{2}$ irradiated by Fe and He Ions
Li-Long Pang1 , Bing-Sheng Li1 , Tie-Long Shen1 , Xing Gao1 , Xue-Song Fang1,2 , Ning Gao1 , Cun-Feng Yao1 , Kong-Fang Wei1 , Ming-Huan Cui1 , Jian-Rong Sun1 , Hai-Long Chang1 , Wen-Hao He1,2 , Qing Huang3 , Zhi-Guang Wang1**
1 Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 7300002 University of Chinese Academy of Sciences, Beijing 1000493 Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201
Abstract ：Ti$_{3}$AlC$_{2}$ samples are irradiated in advance by 3.5 MeV Fe-ion to the fluence of 1.0$\times$10$^{16}$ ion/cm$^{2}$, and then are implanted by 500 keV He-ion with the fluence of 1.0$\times$10$^{17}$ ion/cm$^{2}$ at room temperature. The irradiated samples are investigated by grazing incidence x-ray diffraction (GIXRD) and transmission electron microscopy (TEM). GIXRD results show serious structural distortion, but without amorphization in the irradiated samples. Fe-ion irradiation and He-ion implantation create much more serious structural distortion than single Fe-ion irradiation. TEM results reveal that there are a large number of defect clusters in the damage region, and dense spherical He bubbles appear in the He depositional region. It seems that the pre-damage does not influence the growth of He bubbles, but He-ion implantation influences the pre-created defect configurations.
收稿日期: 2017-10-27
出版日期: 2018-01-23
:
61.72.Dd
(Experimental determination of defects by diffraction and scattering)
61.72.Ff
(Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, x-ray topography, etc.))
61.72.J-
(Point defects and defect clusters)
引用本文:
. [J]. 中国物理快报, 2018, 35(2): 26102-.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/35/2/026102
或
https://cpl.iphy.ac.cn/CN/Y2018/V35/I2/26102
[1] Sun Z M 2011 Mater. Rev. 56 143 [2] Radovic M and Barsoum M W 2013 Am. Ceram. Soc. Bull. 92 20 [3] Yin K D, Zhang X T, Huang Q and Xue J M 2017 Chin. Phys. B 26 60703 [4] Shen H H, Li F Z et al 2017 Ceram. Soc. 37 855 [5] Clark D W, Zinkle S J, Patel M K et al 2016 Acta Mater. 105 130 [6] Huang Q, Liu R, Lei G et al 2015 J. Nucl. Mater. 465 640 [7] Nappé J C, Maurice C, Grosseau P et al 2011 J. Eur. Ceram. Soc. 31 1503 [8] Whittle K R, Blackford M G, Aughterson R D et al 2010 Acta Mater. 58 4362 [9] Yang T, Wang C, Taylor C A et al 2014 Acta Mater. 65 351 [10] Liu X M, Le Flem M, Béchade J L et al 2010 J. Nucl. Mater. 401 149 [11] Tallman D J, Hoffman E N, El'ad N C et al 2015 Acta Mater. 85 132 [12] Ang C, Silva C, Shih C et al 2016 Scr. Mater. 114 74 [13] Mansur L and Coghlan W 1983 J. Nucl. Mater. 119 1 [14] Wang J, Gao X, Wang Z G et al 2015 Chin. Phys. Lett. 32 076101 [15] Liu Y Z, Li B S and Zhang L 2017 Chin. Phys. Lett. 34 052801 [16] Wang C, Yang T, Kong S et al 2013 J. Nucl. Mater. 440 606 [17] Song P, Sun J R, Wang Z G et al 2014 Nucl. Instrum. Methods Phys. Res. Sect. B 326 332 [18] Patel M K, Tallman D J, Valdez J A et al 2014 Scr. Mater. 77 1 [19] Shen H H, Li F Z, Zhang H B et al 2017 J. Nucl. Mater. 485 262 [20] Ziegler J F SRIM 2008 Available from: www.srim.org [21] Qi Q, Cheng G J, Shi L Q et al 2014 Acta Mater. 66 317 [22] Xiao J R, Yang T F, Wang C X, Xue J M and Wang Y G 2015 J. Am. Ceram. Soc. 98 1323 [23] Lian J, Zu X T, Kutty K V G et al 2002 Phys. Rev. B 66 054108 [24] Ofan A, Zhang L, Gaathon O et al 2010 Phys. Rev. B 82 104113 [25] Trinkaus H 1983 Radiat. Eff. 78 189 [26] Glasgow B B and Wolfer W G 1984 J. Nucl. Mater. 122 503 [27] Trinkaus H and Wolfer W G 1984 J. Nucl. Mater. 122 552
[1]
.
[2]
.
[3]
REN Fan;HAO Zhi-Biao;ZHANG Chen;HU Jian-Nan;LUO Yi. High Quality AlN with a Thin Interlayer Grown on a Sapphire Substrate by Plasma-Assisted Molecular Beam Epitaxy
[4]
XU Jian-Ping;SHI Shao-Bo;LI Lan;ZHANG Xiao-Song;WANG Ya-Xin;CHEN Xi-Ming. Effects of Annealing Temperature on Structural and Optical Properties of ZnO Thin Films
[5]
LIU Xing-Fang;SUN Guo-Sheng;LI Jin-Min;ZHAO Yong-Mei;LI Jia-Ye;WANG Lei;ZHAO Wan-Shun;ZENG Yi-Ping. Raman Scattering Detection of Stacking Faults in Free-Standing Cubic-SiC Epilayer
[6]
CHEN Zhi-Tao;;XU Ke;;GUO Li-Ping;YANG Zhi-Jian;;PAN Yao-Bo;;SU Yue-Yong;;ZHANG Han;;SHEN Bo;;ZHANG Guo-Yi;. Mosaic Structure Evolution in GaN Films with Annealing Time Grown by Metalorganic Chemical Vapour Deposition
[7]
WANG Jian-Bo;J. GASTALDI;WANG Ren-Hui. Preliminary Characterization of Loop-Shaped Defect in the AlPdMn Icosahedral Quasicrystal by Conventional X-Ray Topography
[8]
LI Chaorong;MAI Zhenhong;WANG Gang;WANG Yutian;
WU Lansheng;CUI Shufan;XIE Sishen;JIANG Jianhua
. Investigation of C60 Single Crystal by X-Ray Methods
[9]
WANG Yingzong. Improved Method of Behavior Type Analysis
2018, Vol. 35 
