A New Approach for Residual Stress Analysis of GH3535 Alloy by Using Two-Dimensional Synchrotron X-Ray Diffraction
Sheng Jiang1,2*, Ji-Chao Zhang1, Shuai Yan1, and Xiao-Li Li2
1Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China 2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201203, China
Abstract：We propose a new method to evaluate residual stress based on the analysis of a portion of a Debye ring with two-dimensional synchrotron x-ray diffraction. The residual stress of a nickel-based alloy GH3535 evaluated by the proposed method is determined to be $-1149\pm34$ MPa based on the quantitative analysis of the deformation of the (200) reflection, and the residual stress obtained by analyzing THE (111) plane is $-933\pm 68$ MPa. The results demonstrate that the GH3535 alloy surface is highly compressive, as expected for a polishing surface treatment. The proposed method provides insight into the field of residual stress measurement and quantitative understanding of the residual stress states in GH3535.
2020, Vol. 37 
