A Raman Study of the Origin of Oxygen Defects in Hexagonal Manganite Thin Films
CHEN Xiang-Bai1**, HIEN Nguyen Thi Minh2, YANG In-Sang2**, LEE Daesu3, NOH Tae-Won3
1Department of Nano Science & Mechanical Engineering and Nanotechnology Research Center,Konkuk University, Chungju 380-701, Korea 2Department of Physics and Division of Nano-Sciences, Ewha Womans University, Seoul 120-750, Korea 3ReCFI, Department of Physics and Astronomy, Seoul National University, Seoul 151-747, Korea
Abstract:Oxygen defects are usually unavoidable when synthesizing oxide thin films. We study the origin of the oxygen defects in hexagonal manganite HoMnO3 epitaxial thin films through Raman scattering spectroscopy. Our results show that the oxygen defects in hexagonal HoMnO3 thin films have distinct effects on different phonon modes and on magnon scattering. Our analyses indicate that the oxygen defects in hexagonal HoMnO3 thin films mainly originate from the basal O3 and/or O4 oxygen vacancies. Furthermore, our analyses of oxygen defects predict that the Mn 3d orbitals would be more strongly hybridized with the apical O1 and/or O2 2p orbitals than the basal O3 and/or O4 2p orbitals. This prediction is consistent with our resonant Raman scattering study and earlier first-principle calculations of the electronic structures of hexagonal manganites.
. [J]. Chin. Phys. Lett., 2012, 29(12): 126103-126103.
CHEN Xiang-Bai, HIEN Nguyen Thi Minh, YANG In-Sang, LEE Daesu, NOH Tae-Won. A Raman Study of the Origin of Oxygen Defects in Hexagonal Manganite Thin Films. Chin. Phys. Lett., 2012, 29(12): 126103-126103.
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