Investigation of C60 Single Crystal by X-Ray Methods
LI Chaorong, MAI Zhenhong, WANG Gang, WANG Yutian1,
WU Lansheng, CUI Shufan, XIE Sishen, JIANG Jianhua2
Institute of Physics, Academia Sinica, Beijing 100080
1Institute of Semiconductors, Academia Sinica, Beijing 100083,
2Beijing Synchrotron Radiation Laboratory, P. O. Box 918, Beijing 100039
Investigation of C60 Single Crystal by X-Ray Methods
LI Chaorong;MAI Zhenhong;WANG Gang;WANG Yutian1,
WU Lansheng;CUI Shufan;XIE Sishen;JIANG Jianhua2
Institute of Physics, Academia Sinica, Beijing 100080
1Institute of Semiconductors, Academia Sinica, Beijing 100083,
2Beijing Synchrotron Radiation Laboratory, P. O. Box 918, Beijing 100039
Abstract： C60 single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topography and x-ray double crystal diffraction with Cu Kα1 radiation on conventional x-ray source. The results show that the crystal is rather well crystallized. The x-ray topographies give an evidence of dendritic growth mechanism of C60 single crystal, and x-ray double crystal diffraction rocking curve shows that there are mosaic structural defects in the sample. A phase transition at 249 ± 1.5K from a simple cubic to a face centered cubic structure is confirmed by in situ observation of synchrotron radiation white beam x-ray topography with the temperature varing from 230 to 295K.
LI Chaorong;MAI Zhenhong;WANG Gang;WANG Yutian;
WU Lansheng;CUI Shufan;XIE Sishen;JIANG Jianhua
. Investigation of C60 Single Crystal by X-Ray Methods[J]. 中国物理快报, 1995, 12(4): 217-220.
LI Chaorong, MAI Zhenhong, WANG Gang, WANG Yutian,
WU Lansheng, CUI Shufan, XIE Sishen, JIANG Jianhua
. Investigation of C60 Single Crystal by X-Ray Methods. Chin. Phys. Lett., 1995, 12(4): 217-220.
1995, Vol. 12 
