摘要Laser-induced damage is a key lifetime limiter for optics in large laser facilities. Fused silica is tested to find the damage threshold on two different laser facilities of different apertures. The damage threshold shows that the corners of the component are less damage resistant. The acid etch on a corner does not effectively increase the damage threshold. A statistics-based model is presented to extrapolate the threshold data in a small-aperture test to predict the damage threshold under functional conditions.
Abstract:Laser-induced damage is a key lifetime limiter for optics in large laser facilities. Fused silica is tested to find the damage threshold on two different laser facilities of different apertures. The damage threshold shows that the corners of the component are less damage resistant. The acid etch on a corner does not effectively increase the damage threshold. A statistics-based model is presented to extrapolate the threshold data in a small-aperture test to predict the damage threshold under functional conditions.
HUANG Wan-Qing;HAN Wei;WANG Hai-Jun;MIAO Xin-Xiang;YE Ya-Yun;LIFu-Quan;FENG Bin;JING Feng;ZHENG Wan-Guo. Explanation of Laser-Induced Damage Behavior of Fused Silica in a Large-Aperture Laser using a Small-Aperture Damage Test[J]. 中国物理快报, 2009, 26(9): 97901-097901.
HUANG Wan-Qing, HAN Wei, WANG Hai-Jun, MIAO Xin-Xiang, YE Ya-Yun, LIFu-Quan, FENG Bin, JING Feng, ZHENG Wan-Guo. Explanation of Laser-Induced Damage Behavior of Fused Silica in a Large-Aperture Laser using a Small-Aperture Damage Test. Chin. Phys. Lett., 2009, 26(9): 97901-097901.
[1] Official website of Lawrence Livemore National Laboratory(LLNL) https://lasers.llnl.gov/newsroom/project{\_status/ [2] Conder A et al 2008 Proc. SPIE 6720 672010 [3] Huang W Q et al 2009 Chin. Phys. Lett. 26017901 [4] Hrubesh L W et al 2001 Proc. SPIE 4347 553 [5] Kozlowski M R et al 1998 Proc. SPIE 3244 365 [6] Feit M D et al 1998 Proc. SPIE 3244 350 [7] Liu X S, Cheng H J and He L M 2000 Probability andMathematics Statistics (Beijing: Science Press) p 39 (in Chinese) [8] Feit M D et al 1999 Proc. SPIE 3578 226 [9] Weibull W 1951 Appl. Mech. Trans. ASME 18 293