Fabrication of Nanoparticle Pattern Through Atomic Force
Microscopy Tip-Induced Deposition on Modified Silicon Surfaces
LIAO Jian-Hui, HUANG Lan, GU Ning
1 National Laboratory of Molecular and Biomolecular Electronics, Southeast University, Nanjing 210096
2 Center for Nano-Scale Scicence and Technology, Southeast University, Nanjing 210096
Fabrication of Nanoparticle Pattern Through Atomic Force
Microscopy Tip-Induced Deposition on Modified Silicon Surfaces
LIAO Jian-Hui;HUANG Lan;GU Ning
1 National Laboratory of Molecular and Biomolecular Electronics, Southeast University, Nanjing 210096
2 Center for Nano-Scale Scicence and Technology, Southeast University, Nanjing 210096
关键词 ：
85.40.Sz ,
85.40.Hp ,
85.65.+h
Abstract ： With an atomic force microscopy (AFM) tip used as a “nib”and gold colloidal particles as “ink”, patterns of gold colloidal particles have been deposited successfully from AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize the nanoparticles delivered from AFM tip onto the substrate surface.
Key words ：
85.40.Sz
85.40.Hp
85.65.+h
出版日期: 2002-01-01
:
85.40.Sz
(Deposition technology)
85.40.Hp
(Lithography, masks and pattern transfer)
85.65.+h
(Molecular electronic devices)
引用本文:
LIAO Jian-Hui;HUANG Lan;GU Ning. Fabrication of Nanoparticle Pattern Through Atomic Force
Microscopy Tip-Induced Deposition on Modified Silicon Surfaces[J]. 中国物理快报, 2002, 19(1): 134-136.
链接本文:
https://cpl.iphy.ac.cn/CN/
或
https://cpl.iphy.ac.cn/CN/Y2002/V19/I1/134
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