A New Quantity to Characterize Stochastic Resonance

doi:10.1088/0256-307X/32/9/097401

Chin. Phys. Lett.

2015, Vol. 32

Issue (09): 097401 DOI: 10.1088/0256-307X/32/9/097401

CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES

A New Quantity to Characterize Stochastic Resonance

WANG Yu-Xin, ZHAI Ji-Quan, XU Wei-Wei, SUN Guo-Zhu^**, WU Pei-Heng

Research Institute of Superconductor Electronics, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093

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WANG Yu-Xin, ZHAI Ji-Quan, XU Wei-Wei et al 2015 Chin. Phys. Lett. 32 097401

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Abstract In a double-well system, we investigate theoretically the population distribution of a particle perturbed by a weak sinusoidal signal with a Gaussian white noise accompanied. Our numerical simulation shows that the probability of the particle staying in the right potential well, P_R, exhibits an extreme value at specific noise intensity D depending on the frequency of the sinusoidal signal, which is a key feature of stochastic resonance. This is confirmed by calculating the power spectrum of the output signal, in which the extreme value of the amplitude locates at the same noise intensity. These results provide us with a new way to quantify the stochastic resonance by measuring the population distribution of the particle.

Received: 27 March 2015 Published: 02 October 2015

PACS:	74.50.+r	(Tunneling phenomena; Josephson effects)
	03.65.Sq	(Semiclassical theories and applications)
	05.45.-a	(Nonlinear dynamics and chaos)

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https://cpl.iphy.ac.cn/10.1088/0256-307X/32/9/097401 OR https://cpl.iphy.ac.cn/Y2015/V32/I09/097401

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	WANG Yu-Xin
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	WU Pei-Heng

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