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The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell |
| YANG Jie1,2, PENG Gang2, LIU Cai-Long2, LU Han2, HAN Yong-Hao2**, GAO Chun-Xiao2** |
1Department of Fundamental, Aviation University of Airforce, Changchun 130012
2State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012
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| Cite this article: |
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YANG Jie, PENG Gang, LIU Cai-Long et al 2013 Chin. Phys. Lett. 30 060701 |
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Abstract We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample. For the consideration of high accuracy of resistivity measurement, a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer. With this highly insulating layer, the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.
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Received: 15 February 2013
Published: 31 May 2013
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| PACS: |
07.35.+k
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(High-pressure apparatus; shock tubes; diamond anvil cells)
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61.72.uj
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(III-V and II-VI semiconductors)
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62.50.-p
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(High-pressure effects in solids and liquids)
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