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Lateral Resolution and Signal to Noise Ratio in Electrostatic Force Detection Based on Scanning Probe Microscopy |
| ZHANG Dong-Dong1,2, WANG Xiao-Wei1, WANG Rui1,2, WANG Sheng-Nan1,3, CHENG Zhi-Hai1, QIU Xiao-Hui1** |
1National Center for Nanoscience and Technology, Zhongguancun, Beijing 100190
2Academy of Advanced Interdisciplinary Studies, Peking University, Beijing 100871
3Department of Physics, Tsinghua University, Beijing 100084 |
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| Cite this article: |
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ZHANG Dong-Dong, WANG Xiao-Wei, WANG Rui et al 2012 Chin. Phys. Lett. 29 070703 |
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Abstract The lateral resolution (LR) and signal-to-noise ratio (SNR) are the essential factors in the applications of scanning probe microscopy in quantitative measurement of surface charge distribution, potential profile, and dielectric properties. We use a model system to comprise Au nanoparticles (NPs) embedded in a polystyrene (PS) matrix to study the effects of various experimental parameters, such as modulation bias voltage, tip-sample distance, and actual tip shape, on the electrostatic interactions between the tips and samples. The results show that LR and SNR decrease when the tip-sample distance increases, while SNR increases with tip modulation voltage. LR is less sensitive to tip modulation voltage, but shows complex dependence on the sample geometric structure. In combination with a numerical simulation based on the integral capacitance model, the electrostatic force interaction between tip and sample was quantitatively analyzed.
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Received: 03 May 2012
Published: 29 July 2012
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| PACS: |
07.79.-v
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(Scanning probe microscopes and components)
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07.79.Lh
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(Atomic force microscopes)
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68.37.Ps
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(Atomic force microscopy (AFM))
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