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Flat Crystal x-ray Spectrometer for Quantitative Spectral Measurement in the 2–5keV Region |
| ZHAO Yang**, WEI Min-Xi, DENG Bo, ZHU Tuo, HU Zhi-Min, XIONG Gang, SHANG Wan-Li, KUANG Long-Yu, YANG Guo-Hong, ZHANG Ji-Yan, YANG Jia-Min
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Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900
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ZHAO Yang, WEI Min-Xi, DENG Bo et al 2011 Chin. Phys. Lett. 28 060701 |
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Abstract A technique of flat crystal x-ray spectrometer for quantitative spectral measurement is described. For the flat crystal spectrograph geometry, the quantitative reduction of relating the CCD counts back to the photon flux from the x-ray source is established. The absolute calibrations of the integral diffraction coefficients of the crystal and the CCD sensitivity make it possible to measure absolute photons flux within the energy range of 2000–5000 eV. The uncertainty analysis of the calibrations is carried out to obtain the energy resolved uncertainties of crystal and CCD. Thus, the experimental spectra with spectral resolved intensity uncertainties are available. Then, a performing experiment of laser-produced Ti plasma is carried out and the absolute x-ray spectra with intensity uncertainty less than 8.5% are obtained. The technique is promising for absolute spectral measurement of high temperature plasmas in a kilo-electron-volt region.
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| Keywords:
07.85.Nc
52.70.La
52.50.Jm
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Received: 16 February 2011
Published: 29 May 2011
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| PACS: |
07.85.Nc
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(X-ray and γ-ray spectrometers)
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52.70.La
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(X-ray and γ-ray measurements)
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52.50.Jm
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(Plasma production and heating by laser beams (laser-foil, laser-cluster, etc.))
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