| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Numerical Study on Light Localization in Impedance-Matched Meta-Material Random Systems |
CHEN Hui-Ping1,2, YAO Pei-Jun1, LIANG Zi-Xian1,2, JIANG Xun-Ya1, HAN Wen-Da3 |
| 1The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 2Graduate University of Chinese Academy of Sciences, Beijing 100049 3DONGJUN Science and Technology, Co., LTD |
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| Cite this article: |
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CHEN Hui-Ping, YAO Pei-Jun, LIANG Zi-Xian et al 2010 Chin. Phys. Lett. 27 034206 |
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Abstract We investigate the localization properties of light propagating in two-dimensional systems with impedance-matched meta-material scatterers which are randomly positioned. Numerically, the localization length ξ versus the index of meta-material is obtained first. We find that, unlike traditional random systems, the localization length of such meta-material random systems does not depend on the total scattering cross section of scatterers, but on the back-scattering cross-section of scatterers. Furthermore, our analysis shows that there are “back-scattering paths of single scattere” in such meta-material systems, which can cause a strong localization effect. Such back-scattering paths inside single scatterers can be thought of as the supplement to the traditional back-scattering paths of multiple scatterers.
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| Keywords:
42.25.Bs
42.25.Fx
42.70.-a
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Received: 25 November 2009
Published: 09 March 2010
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| PACS: |
42.25.Bs
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(Wave propagation, transmission and absorption)
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42.25.Fx
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(Diffraction and scattering)
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42.70.-a
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(Optical materials)
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