CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
|
|
|
|
Indium-Induced Effect on Polarized Electroluminescence from InGaN/GaN MQWs Light Emitting Diodes |
RUAN Jun1,2, YU Tong-Jun1, JIA Chuan-Yu1, TAO Ren-Chun1, WANG Zhan-Guo2, ZHANG Guo-Yi1 |
1State Key Laboratory for Mesoscopic Physics, School of Physics, Peking University, Beijing 1008712Institute of Semiconductors, Chinese Academy of Sciences, PO Box 912, Beijing 100083 |
|
Cite this article: |
RUAN Jun, YU Tong-Jun, JIA Chuan-Yu et al 2009 Chin. Phys. Lett. 26 087802 |
|
|
Abstract Polarization-resolved edge-emitting electroluminescence (EL) studies of InGaN/GaN MQWs of wavelengths from near-UV (390nm) to blue (468nm) light-emitting diodes (LEDs) are performed. Although the TE mode is dominant in all the samples of InGaN/GaN MQW LEDs, an obvious difference of light polarization properties is found in the InGaN/GaN MQW LEDs with different wavelengths. The polarization degree decreases from 52.4% to 26.9% when light wavelength increases. Analyses of band structures of InGaN/GaN quantum wells and luminescence properties of quantum dots imply that quantum-dot-like behavior is the dominant reason for the low luminescence polarization degree of blue LEDs, and the high luminescence polarization degree of UV LEDs mainly comes from QW confinement and the strain effect. Therefore, indium induced carrier confinement (quantum-dot-like behavior) might play a major role in the polarization degree change of InGaN/GaN MQW LEDs from near violet to blue.
|
Keywords:
78.60.Fi
78.66.Fd
|
|
Received: 08 April 2009
Published: 30 July 2009
|
|
|
|
|
|
[1] Schmidt T J, Cho Y H, Gainer G H, Song J J, Keller S,Mishra U K and DenBaars S P 1998 Appl. Phys. Lett. 73560 [2] Deguchi T, Azuhata T A, Sota T, Chichibu S and Nakamura S1997 Mater. Sci. and Eng. B 50 251 [3] O'Donnell K P, Martin R W and Middleton P G 1999 Phys. Rev. Lett. 82 237 [4] Chou C C, Lee C M, Nee T E and Chyi J L 2000 Appl.Phys. Lett. 76 3902 [5] Chichibu S F et al 2006 Nature Mater. 5 810 [6] Chen C C, Hsieh K L, and Chi G C, Chou C C and Chyi J Iand Chang C A 2001 J. Appl. Phys. 89 5465 [7] Davidson J A, Dawson P, Wang T, Sugahara T, Orton J W andSakai S 2000 Semiconduct. Sci. Technol. 15 497 [8] Riblet P, Hirayama H, Kinoshita A, Hirata A, Sugano T andAoyagi Y 1999 Appl. Phys. Lett. 75 2241 [9] Aumer M E, LeBoeuf S F, Moody B F and Bedair S M 2001 Appl. Phys. Lett. 79 3803 [10] Shakya J, Knabe K, Kim K H, Li J, Lin J Y and Jiang H X2005 Appl. Phys. Lett. 86 091107 [11] Yeo Y C, Chong T C, Li M F and Fan W J 1998 IEEE J.Quantum Electron. 34 526 [12] Kita T, Tamura N and Wada O 2006 Appl. Phys. Lett. 88 211106 [13] Chuang S L and Chang C S 1995 Appl. Phys. Lett. 68 1657 [14] Gan K G, Sun C K, DenBaars S P and Bowers J E 2004 Appl. Phys. Lett. 84 4675 [15] Jia C, Yu T, Tao R, Hu X, Yang Z, Qin Z, Chen Z, andZhang G 2008 Appl. Phys. Lett. 93 171114 [16] Chuang S L and Chang C S 1997 Semiconduct. Sci.Technol. 12 252 [17] Yeo Y C, Chong T C, Li M F and Fan W J 1998 J. Appl.Phys. 84 1813 [18] Tao R, Yu T, Jia C, Chen Z, Qin Z and Zhang G 2009 Phys. Status Solidi A 206 206 [19] Tao R, Yu T, Jia C, Chen Z, Qin Z, and Zhang G 2009 Chin. Phys. B 18 No.6 (in press) [20] Humphreys C J 2007 Philos. Mag. 87 1971 [21] Andreev A D and O'Reilly E P 2000 Thin Solid Films 364 291 [22] Ledentsov N N et al 2000 Thin Solid Films 36740 [23] Jayavel P, Tanaka H, Kita T and Wada O 2004 Appl.Phys. Lett. 84 1820 |
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|