CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Growth-Parameter Spaces and Optical Properties of Cubic Boron Nitride Films on Si(001) |
FAN Ya-Ming1, ZHANG Xing-Wang1,2, YOU Jing-Bi1, YING Jie1, TAN Hai-Ren1, CHEN Nuo-Fu1 |
1Key Lab of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy Sciences, Beijing 1000832Key Laboratory of Ferroelectric and Piezoelectric Materials and Devices of Hubei Province, Hubei University, Wuhan 430062 |
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Cite this article: |
FAN Ya-Ming, ZHANG Xing-Wang, YOU Jing-Bi et al 2009 Chin. Phys. Lett. 26 056801 |
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Abstract Cubic boron nitride (c-BN) films were deposited on Si(001) substrates in an ion beam assisted deposition (IBAD) system under various conditions, and the growth parameter spaces and optical properties of c-BN films have been investigated systematically. The results indicate that suitable ion bombardment is necessary for the growth of c-BN films, and a well defined parameter space can be established by using the P/a-parameter. The refractive index of BN films keeps a constant of 1.8 for the c-BN content lower than 50%, while for c-BN films with higher cubic phase the refractive index increases with the c-BN content from 1.8 at χc=50% to 2.1 at χc=90%. Furthermore, the relationship between n and ρ for BN films can be described by the Anderson-Schreiber equation, and the overlap field parameter γ is determined to be 2.05.
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Keywords:
68.55.Nq
81.05.Ea
78.66.Fd
81.15.Jj
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Received: 06 October 2008
Published: 23 April 2009
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PACS: |
68.55.Nq
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(Composition and phase identification)
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81.05.Ea
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(III-V semiconductors)
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78.66.Fd
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(III-V semiconductors)
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81.15.Jj
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(Ion and electron beam-assisted deposition; ion plating)
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[1] Mirkarimi P B, McCarty K F and Medlin D L 1997 Mater.Sci. Eng. R 21 47 [2] Samantaray C B and Singh R N 2005 Int. Mater. Rev. 50 313 [3] Zhang X W, Boyen H G, Deyneka N, Ziemann P, Banhart F, andSchreck M 2003 Nature Mater. 2 312 [4] Oechsner H 2006 Thin Solid Films 515 33 [5] He B, Chen G H, Li Z Z, Deng J X and Zhang W J 2008 Chin. Phys. Lett. 25 219 [6] Chong Y M, Leung K M, Ma K L, Zhang W J, Bello I and Lee ST 2006 Diamond Relat. Mater. 15 1155 [7] Yang H S, Iwamoto C, Yoshida T 2007 Diamond Relat.Mater. 16 642 [8] Liu L H, Li Y A, Feng W, Li W Q, Zhao C H, Wang Y X andZhao Y N 2005 Chin. Phys. Lett. 22 1205 [9] Zhang X W, Yue J S, Chen G H, Yan H and Liu W J 1998 Acta Phys. Sin. 7 61 [10] Kulisch W and Ulrich S 2003 Thin Solid Films 423 183 [11] Zhang X W, Zou Y J, Wang B, Song X M, Yan H, Chen G H andWong S P 2001 J. Mater. Sci. 36 1957 [12] Franke E, Schubert M, Woollam J A, Hecht J-D, Wagner G,Neumann H and Bigl F 2000 J. Appl. Phys. 87 2593 [13] Zapien J A, Messier R and Collins R W 2001 Appl.Phys. Lett. 78 1982 [14] Zhang X W, Boyen H-G, Yin H, Ziemann P and Banhart F 2005 Diamond Relat. Mater. 14 1474 [15] Zhang X W, Boyen H-G, Ziemann P and Banhart F 2005 Appl. Phys. A 80 735 [16] Mirkarimi P B, McCarty K F, Medlin D L, Wolfer W G,Friedmann T A, Klaus E J, Cardinale G F and Howitt D G 1994 J.Mater. Res. 9 2925 [17] Gielisse P J, Mitra S S, Plendl J N, Griffis R D, MansurL C, Marshall R and Pascoe E A 1967 Phys. Rev. 155 1039 [18] Ishii T and Sato T 1983 J. Crystal Growth 61689. [19] Dworschak W, Jung K and Ehrhardt H 1995 Thin SolidFilms 254 65 [20] Marler B 1988 Phys. Chem. Minerals 16 286 [21] Anderson O L and Schreiber E 1965 J. Geophys. Res. 70 1463 |
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