CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Structure Characterization of Modified Polyimide Films Irradiated by 2MeV Si Ions |
CHEN Tian-Xiang, YAO Shu-De, WANG Kun, WANG Huan, DING Zhi-Bo, CHEN Di |
State Key Laboratory of Nuclear Physics and Technology, Peking University Beijing 100871 |
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Cite this article: |
CHEN Tian-Xiang, YAO Shu-De, WANG Kun et al 2009 Chin. Phys. Lett. 26 026101 |
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Abstract Structures of polyimide (6051) films modified by irradiation of 2.0MeV Si ions with different fluences are studied in detail. Variations of the functional groups in polyimide are investigated by attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR) and Raman spectroscopy. The results indicate that the functional groups can be destroyed gradually with the increasing ion fluence. The variations of structure and element contents are characterized by x-ray diffraction (XRD), Rutherford backscattering spectrometry (RBS) and x-ray photoelectron spectroscopy (XPS). The results indicate that the contents of N and O decrease significantly compared with the original samples, some graphite-like and carbon-rich phases are formed in the process of irradiation.
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Keywords:
61.81.Jh
61.82.Pv
62.20.-x
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Received: 20 October 2008
Published: 20 January 2009
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