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Shapiro Steps in Flux-Trapped Surface Intrinsic Junctions of Bi2Sr2CaCu2O8+δ |
| WEI Yan-Feng1;ZHAO Shi-Ping1;ZHU Xiao-Bo1;CHEN Geng-Hua1;REN Yu-Feng1;YU Hong-Wei1;YANG Qian-Sheng1;HU Yun2 |
| 1Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080
2Department of Physics, University of Science and Technology of China, Hefei 230026 |
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| Cite this article: |
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WEI Yan-Feng, ZHAO Shi-Ping, ZHU Xiao-Bo et al 2005 Chin. Phys. Lett. 22 2051-2054 |
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Abstract Microwave-field responses of the surface intrinsic Josephson junctions (IJJs) of Bi2Sr2CaCu2O8+δ superconductors are investigated. The IJJs are fabricated using an in situ low-temperature cleavage technique, which leads to the well-characterized surface CuO2 double layers and surface junctions. For the surface junctions in the large-junction limit, usually no Shapiro steps appear when a microwave field is applied. It is found that when the junctions are in a flux-trapped state, which is produced by a pulsed current and in which the critical current is significantly suppressed, clear Shapiro steps can be observed. These results are important for the study of the microwave-field properties of vortex-carrying IJJs and may find their use in device applications.
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| Keywords:
74.50.+r
74.72.Hs
85.25.Cp
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Published: 01 August 2005
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