<em>In Situ</em> X-Ray Diffraction Study on Surface Melting of Bi Nanoparticles Embedded in a SiO<sub>2</sub> Matrix

doi:10.1088/0256-307X/31/1/016403

Chin. Phys. Lett.

2014, Vol. 31

Issue (1): 016403 DOI: 10.1088/0256-307X/31/1/016403

CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES

In Situ X-Ray Diffraction Study on Surface Melting of Bi Nanoparticles Embedded in a SiO₂ Matrix

CHEN Xiao-Ming^**, HUO Kai-Tuo, LIU Peng

College of Physics and Information Technology, Shaanxi Normal University, Xi'an 710119

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CHEN Xiao-Ming, HUO Kai-Tuo, LIU Peng 2014 Chin. Phys. Lett. 31 016403

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Abstract Bi nanoparticles embedded in a SiO₂ matrix were prepared via the high energy ball milling method. The melting behavior of Bi nanoparticles was studied by means of differential scanning calorimetry (DSC) and high-temperature in situ X-ray diffraction (XRD). DSC cannot distinguish the surface melting from 'bulk' melting of the Bi nanoparticles. The XRD intensity of the Bi nanoparticles decreases progressively during the in situ heating process. The variation in the normalized integrated XRD intensity versus temperature is related to the average grain size of Bi nanoparticles. Considering the effects of temperature on Debye–Waller factor and Lorentz-polarization factor, we discuss the XRD results in accordance with surface melting. Our results show that the in situ XRD technique is effective to explore the surface melting of nanoparticles.

Received: 06 October 2013 Published: 28 January 2014

PACS:	64.70.D-	(Solid-liquid transitions)
	61.05.cp	(X-ray diffraction)
	65.80.-g	(Thermal properties of small particles, nanocrystals, nanotubes, and other related systems)

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https://cpl.iphy.ac.cn/10.1088/0256-307X/31/1/016403 OR https://cpl.iphy.ac.cn/Y2014/V31/I1/016403

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	CHEN Xiao-Ming
	HUO Kai-Tuo
	LIU Peng

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