| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
|
|
|
|
Transient Photoconductivity in LaRhO$_{3}$ Thin Film |
| Zhi Meng1,2, Lei Shen1,2, Zongwei Ma1, Muhammad Adnan Aslam1,2, Liqiang Xu2, Xueli Xu1,2, Wang Zhu1, Long Cheng1,2, Yuecheng Bian1,2, Li Pi1, Chun Zhou1**, Zhigao Sheng1** |
1Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031
2University of Science and Technology of China, Hefei 230026
|
|
| Cite this article: |
|
Zhi Meng, Lei Shen, Zongwei Ma et al 2019 Chin. Phys. Lett. 36 117801 |
|
|
|
|
Abstract High-quality epitaxial LaRhO$_{3}$ (LRO) thin films on SrTiO$_{3}$ (110) single-crystalline substrates are fabricated by pulsed laser deposition and their photoconductivity properties are studied. The transient photoconductivity (TPC) effect is found in this semiconductor LRO film at room temperature. The magnitude of TPC increases almost linearly with the laser power intensities and the photon energies in visible light range. Moreover, the difference in the TPC results under two airflow conditions confirms that both intrinsic photoinduced carrier accumulation and extrinsic photoinduced heating effects contribute to the magnitude of TPC effect.
|
|
|
Received: 23 July 2019
Published: 21 October 2019
|
|
| PACS: |
78.20.-e
|
(Optical properties of bulk materials and thin films)
|
| |
81.15.Fg
|
(Pulsed laser ablation deposition)
|
| |
07.07.Df
|
(Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing)
|
|
|
| Fund: Supported by the National Key R&D Program of China under Grant Nos 2017YFA0303603 and 2016YFA0401803, the National Natural Science Foundation of China under Grant Nos 11574316, U1532155, 61805256 and U1832106, and the Key Research Program of Frontier Sciences of CAS under Grant No QYZDB-SSW-SLH011. |
|
|
|
| [1] | Vonhelmolt R, Wecker J, Holzapfel B, Schultz L and Samwer K 1993 Phys. Rev. Lett. 71 2331 | | [2] | Rastogi A, Kushwaha A K, Shiyani T, Gangawar A and Budhani R C 2010 Adv. Mater. 22 4448 | | [3] | Beyreuther E, Thiessen A, Grafström S, Eng L M, Dekker M C and Dörr K 2009 Phys. Rev. B 80 075106 | | [4] | Dao L Y, Zhang Z T, Xiao Y T, Zhang M H, Wang S, He J, Jia J S, Yu L J, Sun B and Xiong C M 2019 Acta Phys. Sin. 68 067302 (in Chinese) | | [5] | Tsai S H, Basu S, Huang C Y, Hsu L C, Lin Y G and Horng R H 2018 Sci. Rep. 8 14056 | | [6] | Cauro R, Gilabert A, Contour J P, Lyonnet R, Medici M G, Grenet J C, Leighton C and Schuller I K 2001 Phys. Rev. B 63 174423 | | [7] | Kiryukhin V, Casa D, Hill J P, Keimer B, Vigliante A, Tomioka Y and Tokura Y 1997 Nature 386 813 | | [8] | Yan G Y, Zhang H L, Bai Z L, Wang S F, Wang J L, Yu W and Fu G S 2013 Chin. Phys. Lett. 30 046801 | | [9] | Taniguchi T, Iizuka W, Nagata Y, Uchida T and Samata H 2003 J. Alloys Compd. 350 24 | | [10] | Terasaki I, Shibasaki S, Yoshida S and Kobayashi W 2010 Materials 3 786 | | [11] | Shibasaki S, Takahashi Y and Terasaki I 2009 J. Electron. Mater. 38 1013 | | [12] | Gysling H J, Monnier J R and Apai G 1987 J. Catal. 103 407 | | [13] | Wold A, Post B and Banks E 1957 J. Am. Chem. Soc. 79 6365 | | [14] | Nakamura M, Krockenberger Y, Fujioka J, Kawasaki M and Tokura Y 2015 Appl. Phys. Lett. 106 072103 | | [15] | Pietsch U, Holy V and Baumbach T 2013 High-Resolution X-ray Scattering: from Thin Films to Lateral Nanostructures (Berlin: Springer) | | [16] | Mary T A and Varadaraju U V 1994 J. Solid State Chem. 110 176 | | [17] | Li Y J, Li S L, Gong P, Li Y L, Fang X Y, Jia Y H and Cao M S 2018 Physica E 104 247 | | [18] | Mott N F and Davis E A 1979 Electronic Processes in Non-Crystalline Materials 2nd edn (Oxford: Oxford University Press) | | [19] | Smolyaninova V N, Talanova E, Kennedy R, Kolagani R M, Overby M, Aldaco L, Yong G and Karki K 2007 Phys. Rev. B 76 104423 | | [20] | Li L, Auer E, Liao M, Fang X, Zhai T, Gautam U K, Lugstein A, Koide Y, Bando Y and Golberg D 2011 Nanoscale 3 1120 | | [21] | Deng Z, Meng G, Fang X, Dong W, Shao J, Wang S and Tong B 2019 J. Alloys Compd. 777 52 | | [22] | Law M, Kind H, Messer B, Kim F and Yang P 2002 Angew. Chem. Int. Ed. 41 2405 | | [23] | Chai X, Xing H and Jin K 2016 Sci. Rep. 6 23280 | | [24] | Takubo N, Ogimoto Y, Nakamura M, Tamaru H, Izumi M and Miyano K 2005 Phys. Rev. Lett. 95 017404 |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
