The Near Surface Morphology of P3HT:PCBM Blend Films Studied by Near-Edge X-Ray Absorption Fine Structure

doi:10.1088/0256-307X/31/5/056102

Chin. Phys. Lett.

2014, Vol. 31

Issue (05): 056102 DOI: 10.1088/0256-307X/31/5/056102

CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES

The Near Surface Morphology of P3HT:PCBM Blend Films Studied by Near-Edge X-Ray Absorption Fine Structure

ZENG Xue-Song, SHI Tong-Fei^**, YE Chang-Hui, LI Ning, LI Xin-Hua, WANG Yu-Qi

Key Laboratory of Material Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031

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ZENG Xue-Song, SHI Tong-Fei, YE Chang-Hui et al 2014 Chin. Phys. Lett. 31 056102

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Abstract The microstructure of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl-C₆₁ butyric acid methyl ester (PCBM) blends with various annealing temperatures are investigated in detail by the near-edge x-ray absorption fine structure. Under higher annealing temperature (T_anneal≥160°C), P3HT shows an unusual fluidity and aggregation in the surface. After annealing, the enrichment polymer component recrystallizes and forms a single P3HT phase layer in the surface of blend films. Moreover, it gives direct evidence of the PCBM content diffusing to the near surface of blend films during annealing treatment. These findings are beneficial to improving the morphology of polymer/fullerene blend films.

Published: 24 April 2014

PACS:	61.05.cj	(X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc.)
	72.80.Le	(Polymers; organic compounds (including organic semiconductors))

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https://cpl.iphy.ac.cn/10.1088/0256-307X/31/5/056102 OR https://cpl.iphy.ac.cn/Y2014/V31/I05/056102

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	ZENG Xue-Song
	SHI Tong-Fei
	YE Chang-Hui
	LI Ning
	LI Xin-Hua
	WANG Yu-Qi

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