Chin. Phys. Lett.  2011, Vol. 28 Issue (6): 067806    DOI: 10.1088/0256-307X/28/6/067806
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Efficiency-enhanced AlGaInP Light-Emitting Diodes with Thin Window Layers and Coupled Distributed Bragg Reflectors
CHEN Yi-Xin**, SHEN Guang-Di, ZHU Yan-Xu, GUO Wei-Ling, LI Jian-Jun
Optoelectronic Technology Laboratory, Beijing University of Technology, Beijing 100124
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CHEN Yi-Xin, SHEN Guang-Di, ZHU Yan-Xu et al  2011 Chin. Phys. Lett. 28 067806
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Abstract A new structure of high-brightness light-emitting diodes (LED) is experimentally demonstrated. The thin window layer is composed of a 300-nm-thick indium-tin-oxide layer and a 500-nm-thick GaP layer for both current spreading and light anti-reflection. The two coupled distributed Bragg reflectors (DBRs) with one for reflecting normal incidence light and the other for reflecting inclined incidence light which is emitted to the GaAs substrate are employed in the LED fabrication. The coupled DBRs in the LED can provide high reflectivity with wide-angle reflection. The efficiency-enhanced AlGaInP LED has the luminance intensity increase of more than 50% compared with conventional LEDs and high reliability with the saturation current 130 mA.
Keywords: 78.20.-e      72.80.Ey      82.45.Qr      74.62.Dh      73.20.At     
Received: 03 November 2010      Published: 29 May 2011
PACS:  78.20.-e (Optical properties of bulk materials and thin films)  
  72.80.Ey (III-V and II-VI semiconductors)  
  82.45.Qr (Electrodeposition and electrodissolution)  
  74.62.Dh (Effects of crystal defects, doping and substitution)  
  73.20.At (Surface states, band structure, electron density of states)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/28/6/067806       OR      https://cpl.iphy.ac.cn/Y2011/V28/I6/067806
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CHEN Yi-Xin
SHEN Guang-Di
ZHU Yan-Xu
GUO Wei-Ling
LI Jian-Jun
[1] Chang S J, Su Y K, Yang T, Chang C S, Chen T P and Huang K H 2002 IEEE J. Quantum Electron. 38 10
[2] Streubel K, Linder N, Wirth R and Jaeger A 2002 IEEE J. Sel. Top. Quantum Electron. 8 2
[3] Altieri P, Jaeger A, Windisch R, Linder N, Stauss P, Oberschmid R and Streubel K 2005 J. Appl. Phys. 98 8
[4] Chen Y X, Shen G D, Li J J, Han J R and Xu C 2009 J. Semiconduct. 38 8
[5] Chang S J, Chang C S, Su Y K, Chang P T, Wu Y R, Huang K H and Chen T P 1997 IEEE Photon. Technol. Lett. 9 2
[6] Pierret R F 2004 Semiconductor Device Fundamentals (New York: Prentice Hall) pp 262–263
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